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Masami Terauchi

Institute of Multidisciplinary Research for Advance Materials

Tohoku University

2-1-1 Katahira

Aoba-ku

Japan

[email]@*.tohoku.ac.jp

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Affiliation

Institute of Multidisciplinary Research for Advance Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Japan. 2003 - 2011

References

Development of a cryogenic stage for an ion-milling instrument. Terauchi, M., Satou, F., Sugizaki, H., Suganuma, K. J. Electron. Microsc. (Tokyo) (2011) [Pubmed]
Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy. Terauchi, M., Koike, M., Fukushima, K., Kimura, A. J. Electron. Microsc. (Tokyo) (2010) [Pubmed]
Soft-X-ray emission spectroscopy based on TEM-Toward a total electronic structure analysis. Terauchi, M., Kawana, M. Ultramicroscopy (2006) [Pubmed]
Electronic structure analyses of BN network materials using high energy-resolution spectroscopy methods based on transmission electron microscopy. Terauchi, M. Microsc. Res. Tech. (2006) [Pubmed]
Detection of characteristic signals from as-doped (<1 at.%) regions of silicon by transmission electron microscopy and convergent-beam electron diffraction. Terauchi, M., Tsuda, K., Kawamura, K. J. Electron. Microsc. (Tokyo) (2003) [Pubmed]