V.P. Oleshko
Micro- and Trace Analysis Center
Department of Chemistry
University of Antwerp (UIA)
Wilrijk-Antwerpen
Belgium
Name/email consistency: high
- Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques. Oleshko, V.P., Gijbels, R.H., Van Daele, A.J., Jacob, W.A., Xu, Y.E., Wang, S.E., Park, I.Y., Kang, T.S. Microsc. Res. Tech. (1998)