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Assemi, S. et al.

Assemi, Nalaskowski, Miller, Johnson,

Isoelectric point of fluorite by direct force measurements using atomic force microscopy.

Interaction forces between a fluorite (CaF2) surface and colloidal silica were measured by atomic force microscopy (AFM) in 1 x 10(-3) M NaNO3 at different pH values. Forces between the silica colloid and fluorite flat were measured at a range of pH values above the isoelectric point (IEP) of silica so that the forces were mainly controlled by the fluorite surface charge. In this way, the IEP of the fluorite surface was deduced from AFM force curves at pH approximately 9. 2. Experimental force versus separation distance curves were in good agreement with theoretical predictions based on long-range electrostatic interactions, allowing the potential of the fluorite surface to be estimated from the experimental force curves. AFM-deduced surface potentials were generally lower than the published zeta potentials obtained from electrokinetic methods for powdered samples. Differences in methodology, orientation of the fluorite, surface carbonation, and equilibration time all could have contributed to this difference.[1]

References

Isoelectric point of fluorite by direct force measurements using atomic force microscopy. Assemi, S., Nalaskowski, J., Miller, J.D., Johnson, W.P. Langmuir : the ACS journal of surfaces and colloids. (2006) [Pubmed]

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